BS IEC 60748-2-12-2001 半导体器件.集成电路.数字集成电路.可编程序逻辑设备的空白详细规范
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【英文标准名称】:Semiconductordevices-Integratedcircuits-Digitalintegratedcircuits-Blankdetailspecificationforprogrammablelogicdevices(PLDs)
【原文标准名称】:半导体器件.集成电路.数字集成电路.可编程序逻辑设备的空白详细规范
【标准号】:BSIEC60748-2-12-2001
【标准状态】:现行
【国别】:英国
【发布日期】:2001-06-15
【实施或试行日期】:2001-06-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:程序设计;作标记;识别方法;数字集成电路;逻辑集成电路;集成电路;电气元件;逻辑器件;电气设备;电子设备及元件;质量保证体系;详细规范;半导体器件
【英文主题词】:Detailspecification;Electronicequipmentandcomponents;Integratedlogiccircuits;Programmable;Programmablelogicdevices;Semiconductorcircuits;Semiconductordevices;Specification
【摘要】:Semiconductordevices—Integratedcircuits—Part2-12:Digitalintegratedcircuits—Blankdetailspecificationforprogrammablelogicdevices(PLDs)FOREWORDINTRODUCTIONClause1Markingandorderinginformation1.1Marking1.2Orderinginformation2Applicationrelateddescription3Specificationofthefunction3.1Blockdiagram3.2Identificationandfunctionofterminals3.3Functionaldescription3.4Family-relatedcharacteristics4Limitingvalues(absolutemaximumratingsystem)5Operatingconditions(withinthespecifiedoperatingtemperaturerange),6Electricalcharacteristics6.1Staticcharacteristics6.2Dynamiccharacteristics6.3Timingdiagram6.4Capacitances7Programming7.1Programmingmode7.2Erasingmode(ifapplicable)7.3Numberofprogramming-erasingcycles(whereappropriate)7.4Dataretentioninformation8Additionalinformation9Screening(ifrequired)10Qualityassessmentprocedures10.1Qualificationapprovalprocedures10.2Capabilityapprovalprocedures11Structuralsimilarityprocedures12Testconditionsandinspectionrequirements12.1General12.2Samplingrequirementsandformationofinspectionlots,12.3Inspectiontables12.4Delayeddeliveries13Additionalmeasurementmethod13.1Dataretentiontest(destructivetest)13.2Write/eraseendurance:numberofprogrammingcycles(destructivetest)13.3ProgrammabilityReferencedocumentsTable1-GroupA:Lot-by-lotTable2-GroupB:Lot-by-lotTable3-GroupC:PeriodicTable4-GroupD
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:30P;A4
【正文语种】:英语
【原文标准名称】:半导体器件.集成电路.数字集成电路.可编程序逻辑设备的空白详细规范
【标准号】:BSIEC60748-2-12-2001
【标准状态】:现行
【国别】:英国
【发布日期】:2001-06-15
【实施或试行日期】:2001-06-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:程序设计;作标记;识别方法;数字集成电路;逻辑集成电路;集成电路;电气元件;逻辑器件;电气设备;电子设备及元件;质量保证体系;详细规范;半导体器件
【英文主题词】:Detailspecification;Electronicequipmentandcomponents;Integratedlogiccircuits;Programmable;Programmablelogicdevices;Semiconductorcircuits;Semiconductordevices;Specification
【摘要】:Semiconductordevices—Integratedcircuits—Part2-12:Digitalintegratedcircuits—Blankdetailspecificationforprogrammablelogicdevices(PLDs)FOREWORDINTRODUCTIONClause1Markingandorderinginformation1.1Marking1.2Orderinginformation2Applicationrelateddescription3Specificationofthefunction3.1Blockdiagram3.2Identificationandfunctionofterminals3.3Functionaldescription3.4Family-relatedcharacteristics4Limitingvalues(absolutemaximumratingsystem)5Operatingconditions(withinthespecifiedoperatingtemperaturerange),6Electricalcharacteristics6.1Staticcharacteristics6.2Dynamiccharacteristics6.3Timingdiagram6.4Capacitances7Programming7.1Programmingmode7.2Erasingmode(ifapplicable)7.3Numberofprogramming-erasingcycles(whereappropriate)7.4Dataretentioninformation8Additionalinformation9Screening(ifrequired)10Qualityassessmentprocedures10.1Qualificationapprovalprocedures10.2Capabilityapprovalprocedures11Structuralsimilarityprocedures12Testconditionsandinspectionrequirements12.1General12.2Samplingrequirementsandformationofinspectionlots,12.3Inspectiontables12.4Delayeddeliveries13Additionalmeasurementmethod13.1Dataretentiontest(destructivetest)13.2Write/eraseendurance:numberofprogrammingcycles(destructivetest)13.3ProgrammabilityReferencedocumentsTable1-GroupA:Lot-by-lotTable2-GroupB:Lot-by-lotTable3-GroupC:PeriodicTable4-GroupD
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:30P;A4
【正文语种】:英语
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